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A single probe for imaging photons, electrons and physical forces
Nicolas Pilet1, Yuliya Lisunova, Fabio Lamattina
1Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
Nanotechnology
|May 6, 2016
Summary
This study integrates scanning force microscopy (SFM) with scanning transmission soft x-ray microscopy (STXM), enabling a single probe to detect electrons, photons, and forces for high-resolution material analysis.
Area of Science:
- Materials Science
- Nanotechnology
- Spectroscopy
Background:
- Combining complementary measurement techniques enhances scientific understanding.
- Scanning force microscopy (SFM) offers high lateral resolution.
- Scanning transmission soft x-ray microscopy (STXM) provides spectroscopic information.
Purpose of the Study:
- To develop an SFM probe as an x-ray detector for STXM measurements.
- To enable a single probe for detecting electrons, photons, and physical forces.
- To advance high-resolution material property assessment.
Main Methods:
- Utilizing the NanoXAS instrument for integrated measurements.
- Modifying SFM probe parameters to detect photo-emitted electrons or transmitted photons.
- Employing high aspect ratio coaxial SFM probes for electron detection.
Main Results:
- Demonstrated the capability of an SFM probe to function as an STXM detector.
- Showcased the dual detection of electrons and photons with a single probe.
- Identified current limitations in achieving very high lateral resolution for electron detection.
Conclusions:
- An SFM probe can effectively serve as a versatile detector in STXM.
- Further probe design innovations are needed to overcome resolution limitations.
- This integrated approach offers a powerful tool for nanoscale material characterization.
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