Phase Contrast and Differential Interference Contrast Microscopy
Electron Microscope Tomography and Single-particle Reconstruction
Transmission Electron Microscopy
Imaging Biological Samples with Optical Microscopy
Super-resolution Fluorescence Microscopy
Overview of Electron Microscopy
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Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
Fumio Hosokawa1, Hidetaka Sawada2, Takao Shinkawa3
1BioNet Ltd., 2-3-28 Nishikityo, Tachikwa, Tokyo, Japan; Tokyo Institute of Technology, 4259 Nagatsuta, Midoriku, Yokohama 226-8503, Japan.
A new formula for spatial coherence in aberration-corrected transmission electron microscopy was derived. This formula reveals how different aberrations affect image quality and coherence, aiding in advanced microscopy applications.
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