Nanoscale refractive index fluctuations detected via sparse spectral microscopy

Partial Wave Spectroscopic (PWS) Microscopy has proven effective at detecting nanoscale hallmarks of carcinogenesis in histologically normal-appearing cells. The current method of data analysis requires acquisition of a three-dimensional data cube, consisting of multiple images taken at different illumination wavelengths, limiting the technique to data acquisition on ~30 individual cells per slide. To enable high throughput data acquisition and whole-slide imaging, new analysis procedures were developed that require fewer wavelengths in the same 500-700nm range for spectral analysis. The nanoscale sensitivity of the new analysis techniques was validated (i) theoretically, using finite-difference time-domain solutions of Maxwell's equations, as well as (ii) experimentally, by measuring nanostructural alterations associated with carcinogenesis in biological cells.