Radial distribution function imaging by STEM diffraction: Phase mapping and analysis of heterogeneous nanostructured

Xiaoke Mu1, Di Wang2, Tao Feng3

  • 1Institute of Nanotechnology (INT), Karlsruhe Institute of Technology (KIT), 76344 Eggenstein-Leopoldshafen, Germany; Helmholtz-Institute Ulm for Electrochemical Energy Storage (HIU), Karlsruhe Institute of Technology (KIT), 89081 Ulm, Germany.

Ultramicroscopy
|May 30, 2016
PubMed
Summary

A new transmission electron microscopy (TEM) method enables detailed analysis of nanostructured amorphous materials by combining scanning TEM (STEM) diffraction mapping, radial distribution function (RDF) analysis, and hyperspectral analysis for atomic packing variations.