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Related Experiment Video

Updated: Mar 20, 2026

$Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2$

Studying Soft-matter and Biological Systems over a Wide Length-scale from Nanometer and Micrometer Sizes at the Small-angle Neutron Diffractometer KWS-2

Published on: December 8, 2016

At-wavelength metrology facility for soft X-ray reflection optics.

A Sokolov¹, P Bischoff¹, F Eggenstein¹

¹Helmholtz Zentrum Berlin für Materialien und Energie, Institut für Nanometer Optik und Technologie, Albert-Einstein-Str. 15, 12489 Berlin, Germany.

The Review of Scientific Instruments

|June 3, 2016

Summary

This summary is machine-generated.

A new Optics Beamline at BESSY-II is operational for characterizing optical devices. It provides high-quality UV and XUV measurements, including gratings and nano-optics, with excellent stray light control.

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Area of Science:

Optics and Photonics
Synchrotron Radiation Science
Materials Characterization

Background:

Advanced optical components require precise characterization.
Ultraviolet (UV) and Extreme Ultraviolet (XUV) spectral regions are critical for many applications.
BESSY-II provides a unique facility for advanced light source research.

Purpose of the Study:

To report the successful operation and commissioning of a new Optics Beamline at BESSY-II.
To present performance data validating the beamline's design for characterizing optical devices.
To highlight the beamline's capabilities for UV and XUV spectral measurements.

Main Methods:

Commissioning of a new Optics Beamline coupled with a UHV reflectometer.
At-wavelength characterization of gratings, nano-optical devices, mirrors, and multilayer systems.
Analysis of beamline key parameters including high-order suppression and stray light.

Main Results:

The Optics Beamline is successfully operating at BESSY-II.
Commissioning data correlate well with initial design calculations.
Key parameters like high-order suppression and stray light behavior meet stringent quality requirements.

Conclusions:

The new Optics Beamline is a valuable facility for at-wavelength characterization in the UV and XUV.
The beamline is ready for user operation, supporting research on novel optical devices.
The successful commissioning confirms the beamline's capability to deliver high-quality measurements.