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A cylindrically symmetric "micro-Mott" electron polarimeter.

N B Clayburn1, E Brunkow1, S J Burtwistle1

  • 1Jorgensen Hall, University of Nebraska, Lincoln, Nebraska 68588-0299, USA.

The Review of Scientific Instruments
|June 3, 2016
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Summary

A new Mott electron polarimeter offers a large effective Sherman function (Seff) for precise electron polarization measurements. This compact device shows improved performance, with minimal background noise, making it valuable for electron scattering studies.

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Area of Science:

  • * Physics
  • * Materials Science
  • * Analytical Chemistry

Background:

  • * Mott electron polarimetry is crucial for determining electron spin polarization.
  • * Compact retarding-field Mott polarimeters are essential for in-situ measurements.
  • * Existing designs face limitations in effective Sherman function (Seff) and efficiency.

Purpose of the Study:

  • * To introduce a novel, cylindrically symmetric Mott electron polarimeter.
  • * To characterize its performance, including effective Sherman function (Seff) and efficiency.
  • * To compare its capabilities with existing compact polarimeter designs.

Main Methods:

  • * Fabrication and testing of a novel Mott electron polarimeter.
  • * Measurement of effective Sherman function (Seff) and efficiency (I/Io) at varying energy loss windows.
  • * Utilization of SIMION® electron trajectory simulations for performance analysis.
  • * Investigation of potential sources of false asymmetries.

Main Results:

  • * Achieved maximum Seff of 0.24 ± 0.02 with a 0.5 keV energy loss window.
  • * Maximum efficiency (I/Io) recorded at 3.7 ± 0.2 × 10(-4) at 20 keV.
  • * Figure-of-merit (η) calculated as 9.0 ± 1.6 × 10(-6).
  • * Demonstrated insensitivity to spatial beam fluctuations and negligible background noise.

Conclusions:

  • * The novel Mott electron polarimeter exhibits a relatively large Seff and low efficiency compared to similar devices.
  • * SIMION® simulations explain performance differences and guide design improvements.
  • * The design is robust against beam fluctuations and spurious background, enhancing measurement reliability.