OnDA: online data analysis and feedback for serial X-ray imaging.

Area of Science:

• Crystallography
• Materials Science
• Data Science

Background:

• Serial X-ray diffraction and scattering experiments generate massive data volumes.
• Real-time data analysis is crucial for efficient experimental decision-making.
• Existing tools may not adequately address the demands of high-throughput data collection.

Purpose of the Study:

• To present OnDA (online data analysis), a free and open-source utility for real-time feedback during serial X-ray diffraction and scattering experiments.
• To provide three complete real-time monitors for common serial X-ray imaging experiments.
• To offer a modular framework for developing custom analysis tools.

Main Methods:

• Development of OnDA using open-source libraries and protocols.
• Implementation of three real-time monitors for serial X-ray imaging.
• Creation of a modular set of functions and algorithms for customization.

Main Results:

• OnDA provides essential information for quick decision-making during high-data-rate experiments.
• The utility has been successfully applied to serial crystallography experiments at free-electron laser and synchrotron facilities.
• OnDA facilitates scoring and monitoring of diffraction data.

Conclusions:

• OnDA is an invaluable tool for managing high data throughput in serial X-ray experiments.
• The modular design allows for adaptation and development of new analysis tools.
• OnDA is poised to support future high-throughput facilities like the European X-ray free-electron laser.