Related Experiment Video
Updated: Mar 18, 2026

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
Published on: October 9, 2012
Multi-speckle X-ray photon correlation spectroscopy in the ultra-small-angle X-ray scattering range
Johannes Möller1, Yuriy Chushkin1, Sylvain Prevost1
1ESRF - The European Synchrotron, 38043 Grenoble, France.
This study demonstrates a new X-ray photon correlation spectroscopy (XPCS) setup for studying colloidal dynamics. The advanced instrument enables precise measurements across various length and time scales, offering new research avenues.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Soft Matter Physics
Background:
- X-ray Photon Correlation Spectroscopy (XPCS) is a powerful technique for studying dynamic processes in materials.
- Investigating dynamics in complex and optically opaque colloidal systems presents significant challenges.
- Existing XPCS methods may face limitations in resolution and sensitivity for certain applications.
Purpose of the Study:
- To present and validate a novel multi-speckle XPCS setup for ultra-small-angle measurements.
- To demonstrate the capability of the setup to probe dynamics across diverse time and length scales in colloidal systems.
- To compare the performance of different detector technologies for XPCS applications.
Main Methods:
- Utilizing a long pinhole collimation instrument for ultra-small-angle XPCS.
- Employing two-dimensional photon-counting and high-sensitivity imaging detectors.
- Conducting measurements on colloidal systems to assess dynamic behavior.
Main Results:
- The presented setup successfully measures dynamics on relevant time and length scales for colloidal systems.
- The system allows for the investigation of non-equilibrium dynamics in complex, opaque materials from nanometres to micrometres.
- Radiation-induced effects are minimized due to short X-ray exposure times.
Conclusions:
- The developed ultra-small-angle XPCS setup is feasible and effective for studying colloidal dynamics.
- This instrument opens new research opportunities, particularly for complex and opaque systems.
- Both photon-counting and integrating detectors are suitable for accurate XPCS measurements with this setup.
Related Concept Videos
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used....
Electron Microscope Tomography and Single-particle Reconstruction
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...
2D NMR: Overview of Heteronuclear Correlation Techniques
X-ray Diffraction of Biological Samples
According to Bragg's law, when X-rays strike the sample positioned on a stage, the rays are scattered by the electron clouds around the sample atoms. The X-ray diffraction or scattering is caused by constructive interference of the X-ray waves that reflect off the internal...
Scanning Electron Microscopy
Fundamental Principles
Accelerated...
X-ray Crystallography
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...

