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Uncertainties in Small-Angle Measurement Systems Used to Calibrate Angle Artifacts
Jack A Stone1, Mohamed Amer1, Bryon Faust1
1National Institute of Standards and Technology, Gaithersburg, MD 20899-0001.
We compared autocollimator and Fizeau phase-shifting interferometer measurements for calibrating optical artifacts. Both instruments yielded similar results, suggesting interferometers are a viable alternative for small-angle measurements.
Area of Science:
- Metrology
- Optical Engineering
- Surface Metrology
Background:
- Small-angle measurement systems are crucial for calibrating artifacts like optical polygons.
- Quantifying errors from non-flat artifact surfaces is challenging, impacting orientation interpretation.
- Existing methods face difficulties in accurately assessing uncertainty in surface orientation measurements.
Purpose of the Study:
- To investigate and compare error sources in small-angle measurement systems.
- To evaluate the performance of Fizeau phase-shifting interferometers against autocollimators for artifact calibration.
- To explore the potential of interferometry as an alternative for precise small-angle measurements.
Main Methods:
- Comparison of angle measurements using an autocollimator and a Fizeau phase-shifting interferometer.
- Calibration of optical polygons and analysis of measurement uncertainties.
- Investigating the impact of imperfect, non-flat artifact faces on measurement accuracy.
Main Results:
- Autocollimator and interferometer measurements showed no significant differences in results.
- The Fizeau interferometer provides a clear and robust definition of surface orientation.
- Quantifying interferometer measurement errors appears more straightforward than autocollimator uncertainties.
Conclusions:
- Fizeau phase-shifting interferometers offer a promising alternative to autocollimators for small-angle measurements.
- Interferometry simplifies the quantification of measurement uncertainty, especially with imperfect surfaces.
- Further research may validate interferometers as a superior tool for precise artifact calibration.
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