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Updated: Mar 18, 2026
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All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Published on: January 19, 2018
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Low-temperature-compatible tunneling-current-assisted scanning microwave microscope utilizing a rigid coaxial
Hideyuki Takahashi1, Yoshinori Imai2, Atsutaka Maeda2
1Organization for Advanced and Integrated Research, Kobe University, 1-1, Rokkodai, Nada, Kobe 657-8501, Japan.
The Review of Scientific Instruments
|July 3, 2016
Summary
We developed a new scanning microwave microscope (SMM) probe for cryogenic imaging. This compact, rigid probe achieves 200 nm resolution, enabling detailed analysis of superconducting materials and semiconductor conductivity.
Area of Science:
- Materials Science
- Physics
- Electrical Engineering
Background:
- Stable operation of scanning near-field microwave microscopes (SMM) at cryogenic temperatures requires small, rigid microwave probes.
- Existing probe designs may face limitations in size and signal isolation for high-resolution cryogenic applications.
Purpose of the Study:
- To present a novel design for a tunneling-current-assisted scanning near-field microwave microscope.
- To develop a compact and rigid microwave probe suitable for cryogenic operation within a superconducting magnet.
- To demonstrate the capability of the developed SMM for high-resolution imaging of material properties.
Main Methods:
- Design and fabrication of a coaxial resonator probe with an integrated insulating joint for signal separation.
- Integration of the probe into a tunneling-current-assisted scanning near-field microwave microscope system.
- Application of the SMM for imaging electrically inhomogeneous superconductors and silicon wafers with varying conductivities.
Main Results:
- A coaxial resonator probe of approximately 30 mm length was successfully designed and fabricated, fitting within a 2-in. magnet bore.
- The probe design effectively separates DC and microwave signals without compromising the quality factor, ensuring stable cryogenic operation.
- The SMM achieved a spatial resolution of approximately 200 nm in imaging the microwave response of a superconductor.
- Near-field microwave measurements of silicon wafers demonstrated the probe's ability to differentiate materials based on conductivity.
Conclusions:
- The developed tunneling-current-assisted SMM with a novel cryogenic probe offers high spatial resolution for microwave imaging.
- The probe design is suitable for investigating complex electronic properties of materials at cryogenic temperatures.
- This technology advances the capability for nanoscale characterization of superconductors and semiconductors.
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