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    Accurately characterizing X-ray beam wavefronts is crucial for Coherent X-ray Diffraction Imaging (CXDI). A novel method using a microsphere accurately measures wavefront shape and flux, improving CXDI reliability.

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    Area of Science:

    • Optics and Photonics
    • X-ray Science
    • Coherent Imaging

    Background:

    • Wavefront characterization is vital for coherence-dependent X-ray applications.
    • Coherent X-ray Diffraction Imaging (CXDI) often assumes a planar incoming wave, necessitating validation.
    • Accurate wavefront knowledge improves the reliability of phase retrieval in imaging.

    Purpose of the Study:

    • To develop and demonstrate a method for quantitative X-ray beam wavefront characterization.
    • To assess the validity of the plane wave approximation in CXDI.
    • To measure the X-ray beam's flux distribution and phase front distortions.

    Main Methods:

    • Utilized a micrometer-sized, metal-coated polymer microsphere as a scattering probe.
    • Employed raster-scanning of the microsphere across the X-ray beam.
    • Monitored far-field scattered intensity distributions using a 2D area detector.

    Main Results:

    • Successfully reconstructed the quantitative X-ray wavefront shape and flux distribution.
    • Identified a well-defined central beam region (~16 µm) and an asymmetric outer distribution.
    • Quantified phase front distortion as primarily spherical with an effective radius of 0.55 m.

    Conclusions:

    • The microsphere method provides accurate X-ray wavefront characterization for CXDI.
    • The plane wave approximation's reliability can be assessed using this technique.
    • Reconstructed wavefronts can be represented by Zernike polynomials for detailed analysis.