Related Experiment Video
Updated: Aug 2, 2026
10:39
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
10.2K
Measurement of mean thickness of transparent samples using simultaneous phase shifting interferometry with four
Applied Optics
|July 14, 2016
Summary
A novel interferometric system generates four simultaneous interferograms with phase shifts of π/2. This optical phase calculation enables analysis of static samples and dynamic thermal events.
Area of Science:
- Optics and Photonics
- Interferometry
- Optical Metrology
Background:
- Traditional interferometric systems often face limitations in simultaneous data acquisition and phase shifting.
- Multiplexing techniques are crucial for enhancing the efficiency and information content of optical measurements.
Purpose of the Study:
- To introduce a novel, coupled interferometric system for generating four simultaneous interferograms with π/2 phase shifts.
- To demonstrate the system's capability in analyzing both static transparent samples and dynamic thermal events.
Main Methods:
- A system combining a Sagnac interferometer with two Michelson interferometers was developed.
- Polarization properties were utilized within the Michelson interferometers for multiplexing.
- A four-step algorithm was employed for optical phase calculation.
Main Results:
- The system successfully generated four interferograms with independent π/2 phase shifts.
- Accurate calculation of mean thickness for static transparent samples was achieved.
- The system's efficacy in analyzing a dynamic temperature field of heat flow was demonstrated.
Conclusions:
- The developed interferometric system offers a robust method for simultaneous phase-shifted interferogram generation.
- This technique provides a versatile tool for quantitative analysis in both static and dynamic optical metrology applications.
