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Rakesh Chatterjee1,2, Sakuntala Chatterjee3, Punyabrata Pradhan3
1The Institute of Mathematical Sciences, CIT Campus, Taramani, Chennai 600113, India.
This study examines the symmetric simple exclusion process (SSEP) with moving defects, revealing their impact on system structure and transport. A new SSEP model with sequential updates is also introduced, showing connections to the original model.
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