Ferromagnetism
Semiconductors
The Electrical Double Layer
Metal-Semiconductor Junctions
Electrostatic Boundary Conditions in Dielectrics
Biasing of Metal-Semiconductor Junctions
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Updated: Mar 17, 2026

A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
Published on: April 8, 2018
1Zernike Institute for Advanced Materials, University of Groningen, Netherlands. b.j.kooi@rug.nl b.noheda@rug.nl.
No abstract available in PubMed .