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Split Point Analysis and Uncertainty Quantification of Thermal-Optical Organic/Elemental Carbon Measurements

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Noise-Parameter Uncertainties: A Monte Carlo Simulation.

¹National Institute of Standards and Technology, Boulder, CO 80305.

Journal of Research of the National Institute of Standards and Technology

|July 23, 2016

Summary

This summary is machine-generated.

This study quantifies uncertainties in noise-parameter measurements using Monte Carlo simulations. Results show how input variations impact noise parameter accuracy, aiding measurement enhancement.

Keywords:

amplifier noise measurement errors noise noise measurement simulation uncertainty

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Area of Science:

Electrical Engineering
Metrology

Background:

Accurate noise-parameter measurements are crucial for electronic device characterization.
Quantifying uncertainties in these measurements is essential for reliable performance evaluation.

Purpose of the Study:

To develop and apply a Monte Carlo simulation to assess uncertainties in noise-parameter measurements.
To determine the impact of various underlying quantity uncertainties on noise parameter accuracy.

Main Methods:

Formulation of a Monte Carlo simulation model.
Computation of the dependence of noise parameter uncertainty on underlying quantity uncertainties.
Analysis of uncertainties from reflection coefficients, noise source temperature, connector variability, ambient temperature, and output noise measurement.

Main Results:

Quantified the impact of individual uncertainty sources on noise-parameter measurements.
Presented results for both uncorrelated and correlated uncertainties.
Evaluated the effectiveness of using a cold noise source and measuring the 'reverse configuration' for measurement enhancement.

Conclusions:

The Monte Carlo simulation effectively models uncertainties in noise-parameter measurements.
Identified key sources contributing to measurement uncertainty.
Demonstrated potential enhancements for improving the accuracy of noise-parameter measurements.