Ion-Step Method for Surface Potential Sensing of Silicon Nanowires

Songyue Chen1, Jan W van Nieuwkasteele2, Albert van den Berg2

  • 1Department of Mechanical and Electrical Engineering, Xiamen University , 361005 Xiamen, China.

Analytical Chemistry
|July 27, 2016
PubMed
Summary

This study introduces a new method for sensing surface potential in silicon nanowire field-effect transistors using an "ion-step" stimulus. This technique offers a drift-resistant alternative for precise surface potential measurements.

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