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|July 28, 2016

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Femtosecond pulsed laser interferometry achieves picometer-level displacement resolution, matching continuous wave lasers. Its effective wavelength depends on the optical spectrum for precise time-resolved metrology.

Area of Science:

Optical Metrology
Laser Interferometry
Nanotechnology

Background:

Femtosecond pulsed lasers offer high temporal resolution for dynamic measurements.
Interferometry is crucial for precise displacement sensing.
Understanding pulsed laser behavior in interferometers is key for advanced metrology.

Purpose of the Study:

To experimentally determine the displacement resolution of femtosecond pulsed laser interferometry.
To investigate the link between the laser's optical spectrum and the interferometer's effective wavelength.
To establish the feasibility of picosecond temporal resolution in displacement metrology.

Main Methods:

Utilizing femtosecond pulsed laser interferometry, specifically a Michelson interferometer setup.

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Experimentally measuring displacement resolution and noise floor.

Analyzing the optical spectrum of the pulsed laser to determine the effective wavelength.

Main Results:

Demonstrated displacement noise and noise floor comparable to stabilized continuous wave HeNe lasers.
Achieved a displacement resolution of 1.01 nm RMS and a noise floor of 27.75 fm/√Hz.
Confirmed that a single effective wavelength accurately describes interferometer fringes, but its value is spectrum-dependent.

Conclusions:

Femtosecond pulsed laser interferometry is a viable technique for high-resolution displacement measurements.
The effective wavelength is a critical parameter influenced by the laser's optical spectrum.
Results pave the way for time-resolved displacement metrology with picosecond resolution.