Radiation-induced solidification of ionic liquid under extreme electric field

An extreme electric field on the order of 10(10) V m(-1) was applied to the free surface of an ionic liquid to cause electric-field-induced evaporation of molecular ions from the liquid. The point of ion emission was observed in situ using a TEM. The resulting electrospray emission process was observed to create nanoscale high-aspect-ratio dendritic features that were aligned with the direction of the electric field. Upon removal of the stressing field the features were seen to remain, indicating that the ionic liquid residue was solidified or gelled. Similar electrospray experiments performed in a field-emission scanning electron microscope revealed that the features are created when the high-energy electron beam damages the molecular structure of the ionic liquid. While the electric field does not play a direct role in the fluid modification, the electric stress was critical in detecting the liquid property change. It is only because the electric stress mechanically elongated the fluid during the electrospray process and these obviously non-liquid structures persisted when the field was removed that the damage was evident. This evidence of ionic liquid radiation damage may have significant bearing on electrospray devices where it is possible to produce high-energy secondary electrons through surface impacts of emitted ions downstream of the emitter. Any such impacts that are in close proximity could see reflected secondary electrons impact the emitter causing gelling of the ionic liquid.