Related Experiment Video
Updated: Mar 16, 2026

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy
Published on: March 16, 2020
Baseline correction of AFM force curves in the force-time representation
1smf8097@gmail.com.
Abstract:
This note reports on the proper correction of force data acquired with an atomic force microscope (AFM). The force-time representation is hereby used to obtain the correction factors for the overall offset and slope for a single force-time curve, as the initial force, F0 = F(t0 ), and the rate of change in the force per unit of time, dF/dt, respectively. The report shows that a complete set of force data, including the approach, delay and retraction regions, can be simultaneously corrected in the force-time representation by subtracting the line CLt = F0 + dF/dt·t to the experimental data. The method described here outperforms the one commonly employed in the correction of AFM force curves and highlights the convenience of using the force-time representation for force data processing wherein the artifactual behavior can be expressed as a single, differentiable function of time.
Related Concept Videos
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Two-Dimensional Force System: Problem Solving
The first step to solving a two-dimensional force system problem is to draw a free-body diagram of the object under consideration. This diagram helps identify all the external forces acting on the object, including their...
Central-Force Motion
Two-Dimensional Force System
Forced Oscillations

