Instrument Calibration
Calibration Curves: Linear Least Squares
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
NMR Spectrometers: Resolution and Error Correction
IR Spectrometers
Atomic Absorption Spectroscopy: Instrumentation
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Updated: Mar 16, 2026

Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron
Published on: June 9, 2016
A K Gaigalas1, Lili Wang1, Hua-Jun He1
1Biochemical Science Division National Institute of Standards and Technology, Gaithersburg, MD 20899.
This study presents a method to correct spectral artifacts introduced by splicing partial spectra from charge-coupled device (CCD) detectors. Spectral correction using a reference irradiance source ensures accurate extended-range spectral analysis.
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