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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Published on: October 11, 2016

RCWA-EIS method for interlayer grating coupling.

Congshan Wan, Thomas K Gaylord, Muhannad S Bakir

|August 10, 2016

Summary

This study optimizes the rigorous coupled-wave analysis equivalent-index-slab (RCWA-EIS) method for calculating grating coupling efficiencies. The enhanced method accurately analyzes various grating types, improving chip-to-chip interconnect performance.

Area of Science:

Optoelectronics
Nanophotonics
Computational Electromagnetics

Background:

Accurate calculation of grating coupling efficiencies is crucial for advanced photonic integrated circuits.
Previous work established the rigorous coupled-wave analysis equivalent-index-slab (RCWA-EIS) method for binary gratings.
Interlayer connections in overlaid chips require efficient chip-to-chip coupling.

Purpose of the Study:

To optimize the search algorithms within the RCWA-EIS method for improved equivalent index definition.
To extend the applicability of the RCWA-EIS method to a wider range of grating structures.
To verify the enhanced method's accuracy using an independent numerical technique.

Main Methods:

Optimization of search algorithms in the RCWA-EIS method.

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Extension of RCWA-EIS to analyze parallelogramic, sawtooth, and volume gratings.

Verification of results using the finite-difference time-domain (FDTD) method.

Main Results:

Improved definition of equivalent indices through optimized search algorithms.
Successful application of RCWA-EIS to nonbinary, sawtooth, and volume gratings.
Validation of RCWA-EIS accuracy by FDTD simulations.

Conclusions:

The optimized RCWA-EIS method offers enhanced accuracy and flexibility for analyzing arbitrary 1D gratings.
This advancement facilitates the design and optimization of efficient chip-to-chip interconnects.
The RCWA-EIS method proves to be a versatile tool for photonic device analysis.