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Picosecond Electric-Field-Induced Threshold Switching in Phase-Change Materials
Peter Zalden1,2, Michael J Shu1,3, Frank Chen1,4
1Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA.
Physical Review Letters
|August 20, 2016
Summary
Threshold switching in chalcogenide glasses occurs on ultrafast, subpicosecond timescales, faster than crystal nucleation. This finding supports electronic models and suggests applications for ultrafast electronic switches.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Solid State Chemistry
Background:
- Chalcogenide glasses exhibit threshold switching, a phenomenon crucial for phase-change memory devices.
- Existing models for electronic breakdown in these materials include purely electronic and crystal nucleation-assisted mechanisms.
Purpose of the Study:
- To investigate the timescale of threshold switching in amorphous Ag$_{4}$In$_{3}$Sb$_{67}$Te$_{26}$ using picosecond electric pulses.
- To determine if threshold switching occurs before crystal nucleation, differentiating between electronic models.
Main Methods:
- Excitation of amorphous Ag$_{4}$In$_{3}$Sb$_{67}$Te$_{26}$ using picosecond electric pulses.
- Observation of field-dependent conductivity changes and pulse-driven crystallization.
- Analysis of switching dynamics on subpicosecond timescales.
Main Results:
- Field-dependent reversible changes in conductivity were observed.
- Pulse-driven crystallization was detected.
- Threshold switching was found to occur on subpicosecond timescales, preceding crystal nucleation.
Conclusions:
- The results support purely electronic models for threshold switching in chalcogenide glasses.
- Ultrafast electronic switching is demonstrated, faster than crystal nucleation.
- Potential applications for ultrafast electronic switches are revealed.
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