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An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments

M V Vitorino1, Y Fuchs1, T Dane1

  • 1ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.

Journal of Synchrotron Radiation
|September 1, 2016
PubMed

Keywords:
in situ atomic force microscopyradiation damagesemiconducting organic thin films

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Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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