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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
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Related Experiment Video

Updated: Mar 15, 2026

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
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An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.

M V Vitorino1, Y Fuchs1, T Dane1

  • 1ESRF - The European Synchrotron, 71 Avenue de Martyrs, 38000 Grenoble, France.

Journal of Synchrotron Radiation
|September 1, 2016
PubMed
Summary

A new X-ray atomic force microscope enables in situ nanoscale imaging during X-ray experiments. It observed rapid micrometric hole formation from X-ray nanobeam damage on organic thin films within seconds.

Keywords:
in situ atomic force microscopyradiation damagesemiconducting organic thin films

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Physics

Background:

  • Synchrotron-based X-ray techniques offer high resolution for material analysis.
  • In situ characterization is crucial for understanding dynamic processes like radiation damage.
  • Developing advanced microscopy tools is essential for nanoscale investigations.

Purpose of the Study:

  • To introduce a compact, high-speed X-ray atomic force microscope for in situ synchrotron experiments.
  • To investigate radiation damage effects on semiconducting organic thin films using nanofocused X-ray beams.
  • To characterize the rapid formation of holes induced by X-ray nanobeam irradiation.

Main Methods:

  • Development of a compact, high-speed X-ray atomic force microscope.
  • Utilizing nanofocused X-ray beams for sample irradiation.
  • In situ observation of radiation damage in direct space with nanometric resolution.

Main Results:

  • The developed microscope allows simultaneous characterization during X-ray experiments.
  • Observed the formation of micrometric holes on an organic thin film.
  • Demonstrated that hole formation occurs on a timescale of seconds due to X-ray nanobeam exposure.

Conclusions:

  • The developed X-ray atomic force microscope is effective for in situ nanoscale analysis.
  • Intense X-ray nanobeams can induce rapid structural modifications in organic thin films.
  • The instrument provides valuable insights into radiation damage mechanisms at the nanoscale.