Figure of merit enhancement of surface plasmon resonance sensors using absentee layer

By adding an absentee layer on the top of the metallic layer, the figure of merit (FOM) of a surface plasmon resonance (SPR) sensor with Kretschmann configuration was enhanced, without changing the resonance angle and the reflectance at the resonance angle. Comparing with a traditional SPR sensor, the FOM of the SPR sensor with an absentee layer composed of either 1367 nm thick KCl or 235 nm thick Si₃N₄ can be improved by 5.53% or 11.41%, respectively. The enhancement of the FOM should be attributed to the faster decrease of the full width at half-maximum than the sensitivity after an absentee layer was applied in the SPR sensor.