Topography of Cells Revealed by Variable-Angle Total Internal Reflection Fluorescence Microscopy
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Updated: Mar 14, 2026

Nanotopology of Cell Adhesion upon Variable-Angle Total Internal Reflection Fluorescence Microscopy VA-TIRFM
Published on: October 2, 2012
Marcelina Cardoso Dos Santos1, Régis Déturche1, Cyrille Vézy1
1Laboratoire de Nanotechnologie et d'Instrumentation Optique, Institut Charles Delaunay - UMR 6281 Centre National de la Recherche Scientifique, Université de Technologie de Troyes, Troyes, France.
Abstract:
We propose an improved version of variable-angle total internal reflection fluorescence microscopy (vaTIRFM) adapted to modern TIRF setup. This technique involves the recording of a stack of TIRF images, by gradually increasing the incident angle of the light beam on the sample. A comprehensive theory was developed to extract the membrane/substrate separation distance from fluorescently labeled cell membranes. A straightforward image processing was then established to compute the topography of cells with a nanometric axial resolution, typically 10-20 nm. To highlight the new opportunities offered by vaTIRFM to quantify adhesion process of motile cells, adhesion of MDA-MB-231 cancer cells on glass substrate coated with fibronectin was examined.
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