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Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography

Muhammad Faizan Shirazi1, Kibeom Park2, Ruchire Eranga Wijesinghe3

  • 1School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Bukgu, Daegu 41566, Korea. faizanshirazi110@gmail.com.

Sensors (Basel, Switzerland)
|October 1, 2016
PubMed

Keywords:
GPULCDOCTindustrial inspectionoptical thin film

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