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Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

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Published on: October 24, 2014

Vectorial scanning force microscopy using a nanowire sensor.

Nicola Rossi¹, Floris R Braakman¹, Davide Cadeddu¹

¹Department of Physics, University of Basel, Klingelbergstrasse 82, 4056 Basel, Switzerland.

Nature Nanotechnology

|November 8, 2016

Summary

This summary is machine-generated.

This study demonstrates nanowire (NW) resonators as sensitive vectorial force sensors. By scanning a single NW, researchers mapped spatial tip-sample force derivatives and imaged electric fields with high precision.

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Area of Science:

Nanotechnology
Materials Science
Physics

Background:

Self-assembled nanowire (NW) crystals offer unique properties for nanomechanical resonators.
NWs exhibit small mass, high resonant frequencies, and low dissipation.
Geometric asymmetries cause NW flexural modes to split into orthogonal doublets, enabling vectorial sensing.

Purpose of the Study:

To utilize single nanowires (NWs) as scanning probes for surface imaging.
To map spatial tip-sample force derivatives in a plane.
To image electric force fields, differentiating between NW charge and polarizability effects.

Main Methods:

Growing nearly defect-free nanomechanical resonators from self-assembled nanowire crystals.
Employing a single NW as a scanning probe.
Monitoring frequency shifts and oscillation directions of orthogonal flexural modes during scanning.
Constructing force derivative maps from monitored NW oscillations.

Main Results:

Successful imaging of a sample surface using a single NW probe.
Generation of maps detailing all spatial tip-sample force derivatives.
Distinction between NW charge and polarizability contributions to electric force fields.
Demonstration of a universally applicable technique for mapping weak tip-sample forces.

Conclusions:

Single NWs are highly sensitive vectorial force sensors.
This technique provides a new form of atomic force microscopy.
The method is particularly suited for mapping the magnitude and direction of subtle tip-sample forces.