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Updated: Mar 12, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

Exploiting the speckle-correlation scattering matrix for a compact reference-free holographic image sensor.

KyeoReh Lee¹, YongKeun Park¹

¹Department of Physics and KAIST Institute of Health Science and Technology, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea.

Nature Communications

|November 1, 2016

Summary

Researchers developed a novel reference-free holographic image sensor. This new technology uses a speckle-correlation scattering matrix approach to capture light-field information, overcoming limitations of traditional methods.

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Last Updated: Mar 12, 2026

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Area of Science:

Optics and Photonics
Image Sensing Technologies

Background:

Holography records light's amplitude and wavefront, but direct wavefront measurement is limited by electronics bandwidth.
Reference-field-assisted interferometry, while useful, presents fundamental and practical challenges.

Purpose of the Study:

To demonstrate a novel reference-free holographic image sensor.
To overcome the limitations of existing holographic measurement techniques.

Main Methods:

Proposed a speckle-correlation scattering matrix approach.
Utilized a thin disordered layer (diffusor) and a standard image sensor.
Recorded and retrieved light-field information from single-shot speckle intensity patterns.

Main Results:

Successfully demonstrated a reference-free holographic image sensor.
Enabled direct holographic measurements of three-dimensional optical fields.
Achieved light-field information retrieval through self-interference via diffusive scattering.

Conclusions:

The developed sensor offers a compact and practical solution for holographic measurements.
The speckle-correlation scattering matrix approach provides a viable alternative to traditional interferometric methods.
This advancement paves the way for new applications in optical field characterization.