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Updated: Mar 12, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
A low cost method for hard x-ray grating interferometry
Yang Du1,2, Yaohu Lei1, Xin Liu1
1Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, 518060, Shenzhen, People's Republic of China.
None:
Grating interferometry is advantageous over conventional x-ray absorption imaging because it enables the detection of samples constituted by low atomic number elements (low-Z materials). Therefore, it has a potential application in biological science and medical diagnostics. The grating interferometry has some critical optics components such as absorption gratings which are conventionally manufactured by the lithography, electroplating, and molding (LIGA) technique and employing gold as the absorbent material in it. However, great challenge lies in its implementations for practical applications because of the cost and difficulty to achieve high aspect ratio absorbing grating devices. In this paper, we present a low-cost approach that involves using the micro-casting technique with bismuth (Bi) as the absorber in source grating and as well as filling cesium iodide thallium(CsI:Tl) in a periodically structured scintillator. No costly facilities as synchrotron radiation are required and cheap material is used in our approach. Our experiment using these components shows high quality complementary images can be obtained with contrast of absorption, phase and visibility. This alternative method conquers the limitation of costly grating devices for a long time and stands an important step towards the further practical application of grating interferometry.
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