Determination of plane stress state using terahertz time-domain spectroscopy

THz wave has been increasingly applied in engineering practice. One of its outstanding advantages is the penetrability through certain optically opaque materials, whose interior properties could be therefore obtained. In this report, we develop an experimental method to determine the plane stress state of optically opaque materials based on the stress-optical law using terahertz time-domain spectroscopy (THz-TDS). In this method, two polarizers are combined into the conventional THz-TDS system to sense and adjust the polarization state of THz waves and a theoretical model is established to describe the relationship between phase delay of the received THz wave and the plane stress applied on the specimen. Three stress parameters that represent the plane stress state are finally determined through an error function of THz wave phase-delay. Experiments were conducted on polytetrafluoroethylene (PTFE) specimen and a reasonably good agreement was found with measurement using traditional strain gauges. The presented results validate the effectiveness of the proposed method. The proposed method could be further used in nondestructive tests for a wide range of optically opaque materials.