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Localization and pair breaking parameter in superconducting molybdenum nitride thin films.
Takuya Tsuneoka1, Kazumasa Makise2, Sho Maeda1
1Department of Physics, Kumamoto University, 2-39-1 Kurokami Chuo-ku, Kumamoto 860-8555, Japan.
We studied the superconductor-insulator transition in molybdenum nitride films. Our findings suggest a critical sheet resistance exists, explained by localization theory but with some deviations in thermal fluctuation analysis.
Area of Science:
- Condensed Matter Physics
- Materials Science
- Thin Film Technology
Background:
- Superconductor-insulator transitions are crucial for understanding quantum phenomena in materials.
- Molybdenum nitride films are promising candidates for studying these transitions due to their tunable properties.
Purpose of the Study:
- To investigate the superconductor-insulator transition in molybdenum nitride films.
- To analyze the role of localization theory and thermal fluctuations in this transition.
Main Methods:
- Fabrication of molybdenum nitride films via deposition onto MgO substrates.
- Measurement of critical temperature (Tc) and normal state sheet resistance (R_sheet).
- Analysis using Finkel'stein formula, localization theory, and thermal fluctuation correction terms (Aslamazov-Larkin and Maki-Thompson).
Main Results:
- Superconducting transition temperature (Tc) depression was observed with increasing sheet resistance, consistent with Finkel'stein formula.
- A critical sheet resistance (R_c) for the transition was identified.
- Excess conductance due to thermal fluctuations agreed well with theoretical models, despite some deviations in specific dependencies.
Conclusions:
- Localization theory provides a good framework for understanding the superconductor-insulator transition in these films.
- Deviations observed in thermal fluctuation analysis warrant further investigation.
- The study contributes to the understanding of quantum phase transitions in thin film superconductors.
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