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Published on: August 4, 2018
Full-Field Optical Coherence Tomography Using Galvo Filter-Based Wavelength Swept Laser.
Muhammad Faizan Shirazi1, Pilun Kim2, Mansik Jeon3
1School of Electronics Engineering, College of IT Engineering, Kyungpook National University, 80 Daehak-ro, Bukgu, 41566 Daegu, Korea. faizanshirazi110@gmail.com.
This study introduces a wavelength swept laser optical coherence tomography system for precise surface and thickness measurements. The technology offers effective cross-sectional imaging for various industrial applications, including optical thin films.
Area of Science:
- Optics and Photonics
- Metrology
- Materials Science
Background:
- Optical Coherence Tomography (OCT) is a powerful non-invasive imaging technique.
- Wavelength swept lasers offer advantages in speed and resolution for OCT systems.
- Accurate measurement of sample surfaces and thicknesses is crucial in various industrial fields.
Purpose of the Study:
- To develop and demonstrate a wavelength swept laser-based full-field optical coherence tomography (OCT) system.
- To evaluate the system's capability for measuring surfaces and thicknesses of both refractive and reflective samples.
- To showcase the system's potential for industrial applications, such as optical thin film analysis.
Main Methods:
- Utilized a galvo filter-based wavelength swept laser source.
- Employed a simple Michelson interferometer configuration.
- Synchronized camera acquisition with the swept source for real-time cross-sectional imaging.
- Tested with combinations of refractive and reflective samples, including resolution targets and step height standards.
Main Results:
- Successfully demonstrated cross-sectional imaging of sample surfaces and thicknesses.
- Achieved topographical and cross-sectional information of various sample types.
- Validated the system's effectiveness for thickness measurement of optical thin films.
- Showcased the potential for depth investigation in industrial settings.
Conclusions:
- The developed wavelength swept laser OCT system is effective for measuring surfaces and thicknesses of diverse samples.
- The system provides valuable cross-sectional and topographical data, suitable for industrial quality control.
- This technology holds promise for applications requiring precise metrology of optical components and materials.
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