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Updated: Mar 11, 2026

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy
Published on: February 27, 2015
Application of dynamic impedance spectroscopy to atomic force microscopy
Kazimierz Darowicki1, Artur Zieliński1, Krzysztof J Kurzydłowski2
1Department of Electrochemistry, Corrosion and Materials Engineering, Gdańsk University of Technology, Narutowicza Street 11/12, 80-952 Gdańsk Wrzeszcz, Poland.
Abstract:
Atomic force microscopy (AFM) is a universal imaging technique, while impedance spectroscopy is a fundamental method of determining the electrical properties of materials. It is useful to combine those techniques to obtain the spatial distribution of an impedance vector. This paper proposes a new combining approach utilizing multifrequency scanning and simultaneous AFM scanning of an investigated surface.

