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Updated: Mar 11, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
Onion-peeling inversion of stellarator images
K C Hammond1, R R Diaz-Pacheco1, Y Kornbluth2
1Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USA.
Abstract:
An onion-peeling technique is developed for inferring the emissivity profile of a stellarator plasma from a two-dimensional image acquired through a CCD or CMOS camera. Each pixel in the image is treated as an integral of emission along a particular line-of-sight. Additionally, the flux surfaces in the plasma are partitioned into discrete layers, each of which is assumed to have uniform emissivity. If the topology of the flux surfaces is known, this construction permits the development of a system of linear equations that can be solved for the emissivity of each layer. We present initial results of this method applied to wide-angle visible images of the Columbia Neutral Torus (CNT) stellarator plasma.
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