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Control of secondary electrons from ion beam impact using a positive potential electrode
T P Crowley1, D R Demers1, P J Fimognari1
1Xantho Technologies, LLC, Madison, Wisconsin 53705, USA.
Abstract:
Secondary electrons emitted when an ion beam impacts a detector can amplify the ion beam signal, but also introduce errors if electrons from one detector propagate to another. A potassium ion beam and a detector comprised of ten impact wires, four split-plates, and a pair of biased electrodes were used to demonstrate that a low-voltage, positive electrode can be used to maintain the beneficial amplification effect while greatly reducing the error introduced from the electrons traveling between detector elements.
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