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Updated: Mar 10, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Dianmin Lin1,2, Aaron L Holsteen1, Elhanan Maguid3
1Geballe Laboratory for Advanced Materials, Stanford University , Stanford, California 94305, United States.
Researchers developed multifunctional metasurfaces for advanced optics. These surfaces integrate multiple optical elements without performance loss, enabling novel imaging and display applications.
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