Time-Resolved Chemical Mapping in Light-Emitting Electrochemical Cells
Mohammad Javad Jafari1, Jiang Liu2, Isak Engquist2
1Division of Molecular Physics, Department of Physics, Chemistry and Biology, Linköping University , Linköping SE-581 83, Sweden.
ACS Applied Materials & Interfaces
|December 30, 2016
Summary
Fourier-transform infrared microscopy reveals how ions move and form dynamic p-n junctions in light-emitting electrochemical cells (LECs). This study shows ion redistribution is irreversible in fixed-junction LECs.
Area of Science:
- Organic electronics
- Materials science
- Electrochemistry
Background:
- Understanding ion dynamics and doping is crucial for developing efficient light-emitting electrochemical cells (LECs).
- Realistic conduction models require precise explanations of electrochemical reactions, p-n junction formation, and ion movement within the active layer.
- Systematic improvement of LEC function and manufacturing depends on detailed information about their internal processes.
Purpose of the Study:
- To investigate ion distribution and doping in LECs using in situ techniques.
- To correlate experimental observations with electrochemical doping models.
- To explore the impact of temperature on ion dynamics and junction formation in LECs.
Main Methods:
- Utilized Fourier-transform infrared (FTIR) microscopy for in situ and time-resolved mapping of electrochemical doping.
- Monitored anion density profiles and polymer structure under electrical bias.
- Investigated frozen-junction formation by decreasing working temperature and employing FTIR imaging.
Main Results:
- FTIR microscopy successfully mapped anion density and polymer structure changes during electrochemical doping.
- Observed ion redistribution and dynamic p-n junction formation in agreement with theoretical models.
- Demonstrated irreversible ion redistribution and polymer doping in fixed-junction LECs at low temperatures.
- Confirmed FTIR microscopy as a valuable tool for in situ characterization of electroactive organic materials.
Conclusions:
- In situ FTIR microscopy provides critical insights into ion dynamics and doping mechanisms in LECs.
- The study validates electrochemical doping models concerning ion redistribution and p-n junction dynamics.
- Ion redistribution and doping in LECs exhibit irreversibility, particularly in fixed-junction devices.
- FTIR microscopy is a powerful technique for advancing the understanding and development of organic electronic devices.
Keywords:
FTIR spectroscopic imagingdoping profiledynamic p−n junctionelectrochemical dopinginfrared microspectroscopyion distributionlight-emitting electrochemical cellprincipal component analysis

