Related Experiment Video
Updated: Mar 9, 2026

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy
Published on: March 16, 2020
A New "Quasi-Dynamic" Method for Determining the Hamaker Constant of Solids Using an Atomic Force Microscope
Sean G Fronczak1, Jiannan Dong1, Christopher A Browne1
1Davidson School of Chemical Engineering, Purdue University , 480 Stadium Mall Drive, West Lafayette, Indiana 47907-2100, United States.
A new quasi-dynamic method accurately estimates the Hamaker constant (A) using atomic force microscopy (AFM) by analyzing the contact deflection point. This approach overcomes limitations of previous methods, enabling reliable measurements with optimized cantilever selection and approach speeds.
Area of Science:
- Surface Science and Nanotechnology
- Materials Science
- Physical Chemistry
Background:
- Estimating the Hamaker constant (A) is crucial for understanding van der Waals forces in materials.
- Previous quasi-static methods using atomic force microscopy (AFM) are limited by surface roughness, deformation, and dynamic effects.
- The 'jump-into-contact' method, while common, fails at finite approach speeds due to dynamic tip-surface interactions.
Purpose of the Study:
- To develop a novel, more accurate method for determining the Hamaker constant (A) of solids using AFM.
- To overcome the limitations of existing quasi-static methods by accounting for dynamic AFM tip motion.
- To provide guidelines for experimental implementation, ensuring reliable Hamaker constant measurements.
Main Methods:
- Analysis and extension of the quasi-static 'jump-into-contact' method for Hamaker constant determination.
- Development of a dynamic AFM tip motion model to identify limitations of quasi-static approaches.
- Proposal of a 'quasi-dynamic' method using the contact deflection point (dc) and a double extrapolation procedure for accurate A estimation.
Main Results:
- The quasi-static model fails to represent dynamic tip behavior at close tip-surface separations.
- The new quasi-dynamic method accurately estimates the apparent Hamaker constant (Aapp) by using dc.
- A dimensionless parameter τ was introduced, showing that with appropriate cantilever selection and slow approach speeds, Aapp can be within ~3% of the true Hamaker constant, often eliminating the need for extrapolation.
Conclusions:
- The quasi-dynamic method provides a reliable and accurate approach for measuring the Hamaker constant using AFM.
- Experimental validation confirmed excellent agreement with established methods for amorphous silica, polystyrene, and α-Al2O3.
- The introduced parameter τ facilitates practical experimental design for precise Hamaker constant determination.
Related Concept Videos
Atomic Force Microscopy
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
IR Spectroscopy: Hooke's Law Approximation of Molecular Vibration
According to Hooke's law, the vibrational frequency is directly proportional to...

