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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Updated: Sep 14, 2025

Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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The Effects of Sample Tilt on Atomic Force Microscopy Deflections.

Juan M Vazquez¹, Lucas Ellis¹, Stephen P Beaudoin¹

¹Davidson School of Chemical Engineering, Purdue University, West Lafayette, Indiana 47907-2100, United States.

Langmuir : the ACS Journal of Surfaces and Colloids

|July 25, 2025

Summary

This summary is machine-generated.

Sample and cantilever tilt angles in atomic force microscopy (AFM) experiments were studied. Results show tilt has minimal impact on approach-to-contact and pull-off deflections when samples are well-leveled.

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Area of Science:

Surface science
Nanotechnology
Materials science

Background:

Atomic Force Microscopy (AFM) relies on measuring forces between a probe and sample via cantilever deflection.
Existing AFM models often assume perfect sample leveling, which is rarely achieved in practice.
Both sample and cantilever tilt can affect deflection measurements, particularly in the approach-to-contact phase.

Purpose of the Study:

To computationally and experimentally investigate the effects of sample and cantilever tilt on AFM deflection-distance curves.
To analyze the influence of tilt on both the approach-to-contact (AtC) and pull-off (PO) portions of the curve.
To evaluate the validity of a new AFM model that incorporates tilt effects and surface roughness.

Main Methods:

Utilized a recently developed computational model accounting for attractive/repulsive forces and surface roughness.
Performed AFM experiments using probes of two sizes and a sapphire substrate.
Varied sample tilt angles systematically during experiments to observe deflection changes.

Main Results:

Experimental results showed good agreement with model predictions.
Pull-off (PO) deflections decreased with increasing sample tilt angle.
Approach-to-contact (AtC) deflections were largely unaffected by sample tilt, except at significant angles.

Conclusions:

Sample tilt has a negligible effect on AtC deflections and minimal impact on PO deflections when the sample is reasonably leveled.
The developed model accurately predicts the influence of tilt on AFM measurements.
Optimized sample leveling in AFM experiments is crucial for reliable deflection data.