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Updated: Jun 7, 2025

Covalent Attachment of Single Molecules for AFM-based Force Spectroscopy
Published on: March 16, 2020
Juan M Vazquez1, Wesley Oliver1, Stephen P Beaudoin1
1Davidson School of Chemical Engineering, Purdue University, West Lafayette, Indiana 47907-2100, United States.
This study reveals that short-range repulsive forces significantly impact Hamaker constant calculations using the pull-off method in atomic force microscopy (AFM). Repulsive forces also affect the approach-to-contact method, necessitating their inclusion for accurate measurements.
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