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Updated: Mar 9, 2026

Angle-resolved Photoemission Spectroscopy At Ultra-low Temperatures
Published on: October 9, 2012
An electron energy loss spectrometer based streak camera for time resolved TEM measurements
Hasan Ali1, Johan Eriksson2, Hu Li1
1Electron Microscopy and Nano-Engineering, Applied Materials Science, Department of Engineering Sciences, Uppsala University, Box 534, 75121 Uppsala, Sweden.
Abstract:
We propose an experimental setup based on a streak camera approach inside an energy filter to measure time resolved properties of materials in the transmission electron microscope (TEM). In order to put in place the streak camera, a beam sweeper was built inside an energy filter. After exciting the TEM sample, the beam is swept across the CCD camera of the filter. We describe different parts of the setup at the example of a magnetic measurement. This setup is capable to acquire time resolved diffraction patterns, electron energy loss spectra (EELS) and images with total streaking times in the range between 100ns and 10μs.
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