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Simultaneous two-wavelength phase unwrapping using an external module for multiplexing off-axis holography.

Nir A Turko, Natan T Shaked

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    We developed a dual-wavelength holographic microscopy system for detailed 3D imaging. This advanced technique extends the measurable thickness range of samples, enabling precise quantitative phase imaging.

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    Area of Science:

    • Optics and Photonics
    • Microscopy Techniques
    • Metrology

    Background:

    • Quantitative phase imaging (QPI) is crucial for analyzing transparent and biological samples.
    • Traditional holographic microscopy often faces limitations in the measurable optical thickness range.
    • Extended range QPI is needed for thicker specimens and complex 3D structures.

    Purpose of the Study:

    • To introduce a novel dual-wavelength external holographic microscopy module.
    • To enable quantitative phase imaging of 3D structures with an extended thickness range.
    • To overcome the limitations of single-wavelength holographic microscopy for thick samples.

    Main Methods:

    • Simultaneous acquisition of two off-axis interferograms at different wavelengths.
    • Generation of a synthetic wavelength larger than the sample's optical thickness.
    • Optical multiplexing of interferograms with orthogonal fringe directions for camera acquisition.

    Main Results:

    • Successfully demonstrated quantitative phase imaging of a 7.96 μm step target.
    • Achieved quantitative imaging of 30.5 μm circular copper pillars.
    • Validated the extended thickness range capability of the dual-wavelength system.

    Conclusions:

    • The dual-wavelength holographic microscopy module effectively extends the measurable thickness range for QPI.
    • The synthetic wavelength approach allows for accurate two-wavelength unwrapping of phase data.
    • This technique offers a promising solution for high-resolution 3D imaging of diverse samples.