Related Experiment Video
Updated: Mar 8, 2026

13:58
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
12.3K
Erratum: Vectorized magnetometer for space applications using electrical readout of atomic scale defects in silicon
Scientific Reports
|January 17, 2017
Summary
No abstract available in PubMed .

