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Author Spotlight: Introduction to Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays
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Rotational scanning atomic force microscopy

A Ulčinas1, Š Vaitekonis1

  • 1Department of Nanoengineering, Center for Physical Sciences and Technology, Savanoriu 231, 02300 Vilnius, Lithuania.

Nanotechnology
|January 21, 2017
PubMed

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