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The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
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Chirp Z transform based enhanced frequency resolution for depth resolvable non stationary thermal wave imaging
B Suresh1, Sk Subhani1, A Vijayalakshmi1
1Infrared Imaging Center, K L University, Guntur, India.
The Review of Scientific Instruments
|February 3, 2017
Summary
This study introduces a new post-processing method for frequency modulated thermal wave imaging, enhancing depth resolution using the chirp Z transform. This technique improves defect detection in materials like composites.
Area of Science:
- Non-destructive testing
- Materials science
- Signal processing
Background:
- Frequency modulated thermal wave imaging (FMTWI) is a non-destructive testing (NDT) technique.
- Enhancing depth resolution in FMTWI is crucial for accurate defect characterization.
- Current methods may have limitations in resolving defects at varying depths.
Purpose of the Study:
- To propose and validate a novel post-processing modality for FMTWI.
- To enhance the depth resolution capabilities of FMTWI.
- To compare the defect detection performance against existing techniques.
Main Methods:
- Utilized the chirp Z transform (CZT) for spectral zooming.
- Developed a novel post-processing technique based on CZT.
- Experimentally validated the method on carbon fiber reinforced plastic (CFRP) and mild steel specimens.
- Evaluated defect detection using signal-to-noise ratio (SNR).
Main Results:
- The proposed post-processing modality significantly enhances depth resolution in FMTWI.
- Spectral zooming feature of CZT effectively improves the ability to discern defects at different depths.
- Experimental validation confirmed the effectiveness on CFRP and mild steel.
- The new modality shows competitive or superior defect detection capabilities compared to other methods based on SNR.
Conclusions:
- The novel post-processing modality using chirp Z transform offers superior depth resolution for FMTWI.
- This technique provides an effective approach for enhanced defect detection in NDT applications.
- The findings contribute to advancing thermal wave imaging for material characterization.

