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Dictionary Indexing of Electron Channeling Patterns.

Saransh Singh1, Marc De Graef1

  • 1Department of Materials Science and Engineering,Carnegie Mellon University,5000 Forbes Avenue,Pittsburgh,PA 15213,USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|February 7, 2017
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This study introduces a dictionary-based method for indexing electron channeling patterns (ECPs). The approach accurately determines crystal orientation and detector parameters in materials like poly-silicon.

Keywords:
ECPdictionary matchingdynamical electron scatteringelectron channeling pattern

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Area of Science:

  • Materials Science
  • Crystallography
  • Electron Microscopy

Background:

  • Indexing diffraction patterns is crucial for materials characterization.
  • Electron Channeling Patterns (ECPs) provide crystallographic orientation information.
  • Existing indexing methods can be computationally intensive or less accurate.

Purpose of the Study:

  • To adapt a dictionary-based indexing approach for Electron Channeling Patterns (ECPs).
  • To refine detector parameters and crystal orientation using advanced optimization algorithms.
  • To evaluate the accuracy and reliability of the proposed ECP indexing method.

Main Methods:

  • Utilized a generalized forward projector (GFP) to generate master ECPs.
  • Employed cubochoric representation for uniform sampling of orientation space.
  • Applied derivative-free optimization (Nelder-Mead, BOA) for parameter refinement.

Main Results:

  • The dictionary-based method successfully indexed ECPs in poly-silicon with high accuracy.
  • Achieved a mean disorientation error of 1.0° with a 0.5° standard deviation.
  • Demonstrated robustness across a range of detector parameters.

Conclusions:

  • The dictionary-based approach offers an effective and accurate method for ECP indexing.
  • This technique enhances the precision of crystallographic orientation determination in electron microscopy.
  • The developed method shows promise for routine materials analysis and research.