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Automated Sample Multiplexing by using Combined Precursor Isotopic Labeling and Isobaric Tagging cPILOT
Published on: December 18, 2020
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Statistical modelling of Ion PGM HID STR 10-plex MPS data.
Søren B Vilsen1, Torben Tvedebrink1, Helle Smidt Mogensen2
1Department of Mathematical Sciences, Aalborg University, Denmark.
Forensic Science International. Genetics
|February 15, 2017
Summary
Short tandem repeat (STR) analysis using massively parallel sequencing shows parental longest uninterrupted stretch (LUS) is a better predictor of stutter ratio than allele length. Methods for error removal improve systematic error reduction in STR profiling.
Area of Science:
- Forensic Genetics
- Molecular Biology
- Bioinformatics
Background:
- Massively parallel sequencing (MPS) platforms offer potential advantages for short tandem repeat (STR) analysis.
- Accurate STR profiling relies on understanding and mitigating potential sources of error, including substitution errors, heterozygote imbalance, and stutter.
- Traditional capillary electrophoresis (CE) methods have established quality metrics, necessitating comparable evaluations for MPS-based STR analysis.
Purpose of the Study:
- To evaluate the performance of the Ion PGM platform with the HID STR 10-plex panel for STR marker analysis.
- To investigate quality measures for identifying substitution errors and assess heterozygote balance compared to CE.
- To examine coverage stability, the impact of IonExpress Barcode adapter (IBA) sampling, and the predictive power of allele length and longest uninterrupted stretch (LUS) on stutter and shoulder ratios.
Main Methods:
- Analysis of dilution series and reference profiles using the Ion PGM MPS platform and HID STR 10-plex panel.
- Investigation of quality measures, heterozygote balance, coverage stability, and IonExpress Barcode adapter (IBA) sampling effects.
- Statistical modeling to assess parental longest uninterrupted stretch (LUS) and parental allele length as predictors of stutter and shoulder ratios.
- Application of dynamic thresholds using one-inflated negative binomial (OINB) and geometric models for non-systematic error removal.
Main Results:
- Average marker coverage was not a reliable predictor of template DNA amount due to multiplex identifier (MID) sampling.
- Parental LUS demonstrated superior predictive power for stutter ratio compared to parental allele repeat length, particularly for complex STR markers (e.g., TH01 R² of 0.78 vs. 0.02).
- The OINB and geometric models effectively reduced non-systematic noise, leaving an average of 1.8 and 1.2 systematic errors per STR system, respectively.
Conclusions:
- The Ion PGM platform with the HID STR 10-plex panel can be utilized for STR analysis, but coverage metrics require careful interpretation.
- Parental LUS is a more robust predictor of stutter ratio than parental allele length, especially for challenging STR loci.
- Advanced statistical models effectively mitigate non-systematic errors, enhancing the reliability of MPS-based STR profiling.
Keywords:
Heterozygote balanceMassively parallel sequencingNoiseQuality of MPSShort tandem repeatsStutters
