RixsToolBox: software for the analysis of soft X-ray RIXS data acquired with 2D detectors

Area of Science:

• Materials Science
• Spectroscopy
• Data Analysis Software

Background:

• Resonant inelastic X-ray scattering (RIXS) is a powerful technique for material characterization.
• Analyzing RIXS data, especially from new high-resolution spectrometers, presents significant challenges.
• Existing data processing methods can be complex and time-consuming for users.

Purpose of the Study:

• To develop a user-friendly software with a graphical interface for RIXS data analysis.
• To streamline the data reduction process from raw CCD images to RIXS spectra.
• To provide tools for advanced data analysis and instrumental parameter extraction.

Main Methods:

• Development of a modular software package with a graphical user interface.
• Implementation of full charge integration and single-photon centroiding for data processing.
• Integration of modules for data reduction, analysis, and instrument calibration.

Main Results:

• The software successfully processes large datasets of 2D CCD images into single RIXS spectra.
• It accommodates both high-flux and high-resolution data acquisition requirements.
• Routine use over a year has led to incorporation of numerous user-driven features.

Conclusions:

• The developed software effectively facilitates RIXS data analysis for users of the ESRF beamline ID32.
• It provides an intuitive platform for real-time data visualization and understanding.
• The tool enhances experimental efficiency by enabling better control and steering during data acquisition.