Optical method to measure the surface of objects by using only one photo

Applied Optics
|March 2, 2017
PubMed
Summary

This study introduces a novel method for measuring object dimensions using a single defocused photograph. The technique reliably determines depth by analyzing edge blur, offering a new approach to dimensional measurement.

Related Concept Videos

Methods of Obtaining Topography01:25

Methods of Obtaining Topography

Topography involves measuring and mapping land elevations, natural features, and artificial structures to create accurate representations of the terrain. Topographic surveying relies on traditional and modern methods, each with distinct advantages and limitations.Traditional Surveying Methods:Transit stadia surveys and plane table surveys were widely used traditional surveying methods. These techniques relied on instruments like theodolites and stadia rods for measuring distances and angles,...
378
Topographic Surveying and Contours01:29

Topographic Surveying and Contours

Topographic surveying is critical for documenting the Earth's surface, focusing on capturing elevations, slopes, and natural and man-made features. It is essential in construction planning, water resource management, and land-use analysis. The primary outcome of such surveys is a topographic map, which uses contour lines to visually represent the shape and slope of the terrain, providing valuable insights into the landscape's characteristics.Contour lines are fundamental to understanding the...
1.2K
Plotting of Topographic Maps01:29

Plotting of Topographic Maps

Topographic maps represent the Earth's surface features using contour lines, which connect points of equal elevation to create a two-dimensional representation of three-dimensional terrain. Creating a topographic map requires a systematic approach.Begin by plotting a scaled grid and marking intersections corresponding to the survey's elevation data points. Assign elevation values at these intersections to build the base map. Next, determine contour levels using a consistent contour interval,...
661
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.6K
Profile Leveling and Cross Sections01:26

Profile Leveling and Cross Sections

Profile leveling and cross-sections are surveying methods used to determine and document terrain elevations for infrastructure projects such as highways, railroads, canals, and pipelines. These methods provide data for earthwork planning and alignment of proposed routes.  Profile leveling involves measuring elevations along a fixed line to create a vertical terrain profile. A surveyor sets up a leveling instrument at the benchmark (BM) and records a backsight (BS) to determine the...
1.9K