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Cleaning of contaminated MFM probes using a BOPP film and external magnetic field
Chao Zhang1, Jinyun Liu2, Qingling Meng1
1JR3CN & CNM, Changchun University of Science and Technology, Changchun 130022, China.
Abstract:
When magnetic samples are tested with a magnetic force microscope (MFM), the probe tip can inevitably be contaminated and magnetic particles are often adhered to the tip surface. The probe with magnetic contamination will seriously affect the quality of morphological and magnetic imaging. In the work, a method for the cleaning of contaminated magnetic probe tips was developed by the use of a biaxially-oriented polypropylene (BOPP) film together with an external magnet field in an MFM system. In the experiments, an MFM system was used for manipulating the tip to push into the BOPP film with a depth of 50-100nm under a magnetic field and hold for 5s, and the relationships between loading forces and separating forces were studied. The scanning electron microscope (SEM) images have shown that the use of the BOPP film together with an external magnet field is effective for the cleaning of contaminated MFM probes. This method can greatly improve the quality of magnetic imaging, prolong the service life of magnetic probes and reduce the experimental costs in many MFM applications.
Insights
Contaminated magnetic force microscope (MFM) probe tips can be effectively cleaned using a biaxially-oriented polypropylene (BOPP) film and an external magnetic field. This method enhances imaging quality and probe lifespan.
Area of Science:
- Materials Science
- Surface Science
- Nanotechnology
Background:
- Magnetic Force Microscopy (MFM) is crucial for analyzing magnetic materials.
- Probe tip contamination by magnetic particles degrades imaging quality and accuracy.
- Maintaining probe integrity is essential for reliable MFM experiments.
Purpose of the Study:
- To develop an effective cleaning method for contaminated MFM probe tips.
- To investigate the use of biaxially-oriented polypropylene (BOPP) film for probe cleaning.
- To assess the impact of an external magnetic field on the cleaning process.
Main Methods:
- A novel cleaning technique utilizing BOPP film and an external magnetic field within an MFM system was employed.
- MFM probes were manipulated to penetrate the BOPP film (50-100nm depth) under a magnetic field for 5 seconds.
- Loading and separating forces were analyzed to understand the cleaning mechanism.
Main Results:
- Scanning Electron Microscope (SEM) images confirmed the effectiveness of the BOPP film and magnetic field in removing contaminants.
- The cleaning method significantly improved the quality of morphological and magnetic imaging.
- The procedure demonstrated a reduction in probe contamination and an increase in probe longevity.
Conclusions:
- The BOPP film and external magnetic field method offers an efficient solution for cleaning contaminated MFM probes.
- This technique enhances MFM imaging performance, extends probe service life, and reduces experimental costs.
- The developed method is beneficial for various MFM applications requiring high-quality magnetic imaging.
